SEM Laboratory 24 01 10-DM-TAKE 1

Scanning Electron Microscope (SEM) Laboratory

Scanning Electron Microscope (SEM)
The Scanning Electron Microscope (SEM) has, over the last decade, become an essential tool for materials research. The SEM in the Mechanical Engineering Department is equipped with a secondary electron (SE) detector and a back-scattered electron (BSE) detector, which together with an EDS (Energy Dispersive X-ray Spectroscopy) system, enable chemical analysis. The SEM is used by ORT Braude College researchers in their projects and to teach students about high resolution microscopy.

A stereoscope is an optical microscope of a special kind, characterized by a large depth of field compared to a conventional optical microscope. The device provides a 3D image of objects viewed through it.  These capabilities make the stereoscope essential for SEM filament replacement.






Sputtering Machine
Physical vapor deposition of an Au layer on the top surface of specimens, via a sputtering machine, is one stage in the SEM specimen preparation process. The Au layer improves the specimen's conductivity and hence better imaging and higher resolution are obtained. Non-conductive specimens can be studied after Au sputtering as well.

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